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Ex Parte Patent Reexamination & Patent Reissue - Opportunities and Pitfalls

Recorded on: Jan. 11, 2011
Running Time: 01:01:49

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Taken from the Web Program Reissue and Reexamination Strategies and Tactics with Concurrent Litigation 2011 recorded January, 2011 in San Francisco.

Lecture Topics [01:01:49]

Ex Parte Patent Reexamination & Patent Reissue - Opportunities and Pitfalls [01:01:49]

Patent owners may, in some cases, pursue patent reissue and/or ex parte patent reexamination to correct a mistake, or explore an issue of validity of their issued patent. Likewise, third parties may seek to challenge the patent rights of others through an anonymous ex parte patent reexamination, or monitor an ongoing patent reissue activity to gauge future liability. Whether a Patent owner or third party, a clear understanding is needed of the interplay, and potential impact of these proceedings. Important differences between patent reissue and ex parte reexamination are reviewed in light of the evolving treatment of these issues before the USPTO, as well as strategic implications of both proceedings.

The purchase price of this Web Program segment includes the following article from the Course Handbook available online:
  • Ex Parte Patent Reexamination & Patent Reissue--Opportunities and Pitfalls
    W. Todd Baker

Presentation Material

  • Ex Parte Patent Reexamination & Patent Reissue - Opportunities and Pitfalls
    W. Todd Baker
  • Ex Parte Patent Reexamination & Patent Reissue - Opportunities and Pitfalls
    W. Todd Baker
  • Ex Parte Patent Reexamination & Patent Reissue - Opportunities and Pitfalls
    W. Todd Baker
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